Journal of Semiconductors(2011年07期)
半導(dǎo)體學(xué)報(bào)(英文版)

目 錄

• Photoconductive properties of organic-inorganic Ag/p-CuPc/n-GaAs/Ag cell
• Effect of annealing process on the surface roughness in multiple Al implanted 4H-SiC
• Effect of current on the microstructure and performance of (Bi_2Te_3)_(0.2)(Sb_2Te_3)_(0.8) thermoelectric material via field activated and pressure assisted sintering
• Gate current modeling and optimal design of nanoscale non-overlapped gate to source/drain MOSFET
• New analytical threshold voltage model for halo-doped cylindrical surrounding-gate MOSFETs
• Characteristics and optimization of 4H-SiC MESFET with a novel p-type spacer layer incorporated with a field-plate structure based on improved trap models
• Analytical drain current model for amorphous IGZO thin-film transistors in above-threshold regime
• A novel lateral IGBT with a controlled anode for on-off-state loss trade-off improvement
• A new high voltage SOI LDMOS with triple RESURF structure
• Simulation study of new 3-terminal devices for high speed STT-RAM
• Fabrication of ZnO nanowall-network ultraviolet photodetector on Si substrates
• Sensitivity of MEMS microwave power sensor with the length of thermopile based on Fourier equivalent model
• A novel structure of silicon-on-insulator microring biosensor based on Young‘s two-slit interference and its simulation
• A sub-sampling 4-bit 1.056-GS/s flash ADC with a novel track and hold amplifier for an IR-UWB receiver
• A 50 MHz-1 GHz high linearity CATV amplifier with a 0.15μm InGaAs PHEMT process
• A wideband CMOS VGLNA based on single-to-differential stage and resistive attenuator for TV tuners
• A low noise high efficiency buck DC-DC converter with sigma-delta modulation
• A pseudo differential Gm-C complex filter with frequency tuning for IEEE802.15.4 applications
• Design of a total-dose radiation hardened monolithic CMOS DC-DC boost converter
• Design of a high performance CMOS charge pump for phase-locked loop synthesizers
• A 9.8-mW 1.2-GHz CMOS frequency synthesizer with a low phase-noise LC-VCO and an I/Q frequency divider
• Reducing test-data volume and test-power simultaneously in LFSR reseeding-based compression environment
• On modeling the digital gate delay under process variation
• A novel high reliability CMOS SRAM cell
• A radiation-hardened SOl-based FPGA
• A process-insensitive thermal protection circuit
• Dry etching of poly-Si/TaN/HfSiON gate stack for advanced complementary metal-oxide-semiconductor devices
• Effect of alkaline slurry on the electric character of the pattern Cu wafer